Defect Reduction for Compound Semi Use Cases
Defect Reduction on GaAs, InP and other Compound Semi Wafers for Communications & Sensing Applications Using Candela®.
Discussion of defect inspection and defect reduction by Candela® systems on GaAs, lnP and other compound semiconductor wafers used for communications and sensing devices.
| Event Date: | Tuesday, February 22, 2022 |
