Spectral Reflectance with the F40 Microscope
Discussion of small spot size for spectral reflectance measurements, including guidelines for measuring thick metal films.
Event Date: | Tuesday, May 11, 2021 |
You've selected to view this site translated by Google Translate.
KLA China has the same content with improved translations.
Would you like to visit KLA China instead?
您已选择查看由Google翻译翻译的此网站。
KLA中国的内容与英文网站相同并改进了翻译。
你想访问KLA中国吗?
If you are a current KLA Employee, please apply through the KLA Intranet on My Access.