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Profilm3D: measuring step heights with white light interferometry

The first foray into the vast number of applications that optical profilometers serve; measuring step heights (coating thickness, etch depth, etc.). We will cover basic topics such as: sample preparation, best practices for data acquisition, and various methods for calculating a step height. We will also discuss transparent films and step heights for different materials, including metals.

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Event Date: Tuesday, October 20, 2020

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