The simultaneous measurement of reflectance and transmittance can be a powerful tool for optical films. Welcome to the unique world of the F10-RT. Obviously, this will limit us to films on transparent substrates, but it opens up the ability to measure optical constants (particularly k) with confidence. In addition to colorful dielectric films, there will be a discussion of measuring metal films up to hundreds of nms.
Event Date: | Tuesday, September 15, 2020 |
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