Filmetrics® F54-XY-200 和 F54-XY-300 薄膜厚度测量测绘仪

Filmetrics® F54-XY-200 和 F54-XY-300 薄膜厚度测量测绘仪

F54-XY 系列自动桌上型测绘系统可测量直径高达 300 毫米、带图案样品的薄膜厚度、折射率、反射率、吸收率和表面粗糙度。 五种配置可测量的薄膜厚度范围为 4 纳米至 120 微米,光斑尺寸范围为 2 微米至 100 微米。

产品咨询或服务咨询?

联系我们

Are you sure?

You've selected to view this site translated by Google Translate.
KLA China has the same content with improved translations.

Would you like to visit KLA China instead?


您已选择查看由Google翻译翻译的此网站。
KLA中国的内容与英文网站相同并改进了翻译。

你想访问KLA中国吗?

If you are a current KLA Employee, please apply through the KLA Intranet on My Access.

Exit